Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/56394
Title: Detection and characterization of inclusions in impedance tomography
Authors: Schmitt, Susanne
Issue Date: 2011
Publisher: KIT Scientific Publishing
URI: http://localhost:8080/xmlui/handle/123456789/56394
ISBN: 9783866446359
Appears in Collections:0.1 Data Processing & Computer Science

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