Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/56254| Title: | New Methods to Improve Large-Scale Microscopy Image Analysis with Prior Knowledge and Uncertainty |
| Authors: | Stegmaier, Johannes |
| Issue Date: | 2017 |
| Publisher: | KIT Scientific Publishing |
| URI: | http://localhost:8080/xmlui/handle/123456789/56254 |
| ISBN: | 9783731505907 |
| Appears in Collections: | 0.1 Data Processing & Computer Science |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| New Methods to Improve Large-Scale Microscopy Image Analysis with Prior Knowledge and Uncertainty.pdf | 346.68 kB | Adobe PDF | View/Open |
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