Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/56254
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dc.contributor.authorStegmaier, Johannes-
dc.date.accessioned2026-09-08T14:57:20Z-
dc.date.available2026-09-08T14:57:20Z-
dc.date.issued2017-
dc.identifier.isbn9783731505907-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/56254-
dc.language.isoenen_US
dc.publisherKIT Scientific Publishingen_US
dc.titleNew Methods to Improve Large-Scale Microscopy Image Analysis with Prior Knowledge and Uncertaintyen_US
dc.typeBooken_US
Appears in Collections:0.1 Data Processing & Computer Science



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