Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/56254
Title: New Methods to Improve Large-Scale Microscopy Image Analysis with Prior Knowledge and Uncertainty
Authors: Stegmaier, Johannes
Issue Date: 2017
Publisher: KIT Scientific Publishing
URI: http://localhost:8080/xmlui/handle/123456789/56254
ISBN: 9783731505907
Appears in Collections:0.1 Data Processing & Computer Science



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