Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/49072Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Zhong Lin Wang | - |
| dc.date.accessioned | 2025-12-15T04:24:26Z | - |
| dc.date.available | 2025-12-15T04:24:26Z | - |
| dc.date.issued | 2005 | - |
| dc.identifier.isbn | 0521017955 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/49072 | - |
| dc.language.iso | en | en_US |
| dc.title | Reflection Electron Microscopy and Spectroscopy for Surface Analysis | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | 530 Physics | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Reflection Electron Microscopy and Spectroscopy for Surface Analysis.pdf | 197.55 kB | Adobe PDF | View/Open |
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