Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/43678
Title: Atomic-force Microscopy and Its Applications
Authors: Tański, Tomasz Staszuk
Marcin Ziębowicz, Bogusław
Issue Date: 2019
Publisher: Intech open
URI: http://localhost:8080/xmlui/handle/123456789/43678
ISBN: 9781789851700, 9781789851694, 9781838817763
Appears in Collections:540 Chemistry

Files in This Item:
File Description SizeFormat 
Atomic-force Microscopy and Its Applications.pdf473.02 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.