Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/41056Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Tomasz Tański, Bogusław Ziębowicz | - |
| dc.contributor.author | Marcin Staszuk | - |
| dc.date.accessioned | 2024-07-23T10:57:00Z | - |
| dc.date.available | 2024-07-23T10:57:00Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.isbn | 9781789851700 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/41056 | - |
| dc.language.iso | en | en_US |
| dc.publisher | IntechOpen | en_US |
| dc.title | Atomic-force Microscopy and Its Applications | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | 540 Chemistry | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Atomic-force Microscopy and Its Applications.pdf | 280.91 kB | Adobe PDF | View/Open |
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