Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/28804Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hennen, Leonhard | - |
| dc.contributor.author | Hahn, Julia | - |
| dc.contributor.author | Ladikas, Miltos | - |
| dc.contributor.author | Lindner, Ralf | - |
| dc.contributor.author | Peissl, Walter | - |
| dc.contributor.author | van Est, Rinie | - |
| dc.date.accessioned | 2023-03-26T06:08:05Z | - |
| dc.date.available | 2023-03-26T06:08:05Z | - |
| dc.date.issued | 2023 | - |
| dc.identifier.citation | https://doi.org/10.1007/978-3-031-10617-0 | en_US |
| dc.identifier.isbn | 978-3-031-10617-0 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/28804 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Cham | en_US |
| dc.title | Technology Assessment in a Globalized World | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | POLITICAL | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Technology Assessment in a Globalized World.pdf | 377.2 kB | Adobe PDF | View/Open |
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