Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/28804
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dc.contributor.authorHennen, Leonhard-
dc.contributor.authorHahn, Julia-
dc.contributor.authorLadikas, Miltos-
dc.contributor.authorLindner, Ralf-
dc.contributor.authorPeissl, Walter-
dc.contributor.authorvan Est, Rinie-
dc.date.accessioned2023-03-26T06:08:05Z-
dc.date.available2023-03-26T06:08:05Z-
dc.date.issued2023-
dc.identifier.citationhttps://doi.org/10.1007/978-3-031-10617-0en_US
dc.identifier.isbn978-3-031-10617-0-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/28804-
dc.language.isoenen_US
dc.publisherSpringer Chamen_US
dc.titleTechnology Assessment in a Globalized Worlden_US
dc.typeBooken_US
Appears in Collections:POLITICAL

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