Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/28804
Title: Technology Assessment in a Globalized World
Authors: Hennen, Leonhard
Hahn, Julia
Ladikas, Miltos
Lindner, Ralf
Peissl, Walter
van Est, Rinie
Issue Date: 2023
Publisher: Springer Cham
Citation: https://doi.org/10.1007/978-3-031-10617-0
URI: http://localhost:8080/xmlui/handle/123456789/28804
ISBN: 978-3-031-10617-0
Appears in Collections:POLITICAL

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