Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/28804| Title: | Technology Assessment in a Globalized World |
| Authors: | Hennen, Leonhard Hahn, Julia Ladikas, Miltos Lindner, Ralf Peissl, Walter van Est, Rinie |
| Issue Date: | 2023 |
| Publisher: | Springer Cham |
| Citation: | https://doi.org/10.1007/978-3-031-10617-0 |
| URI: | http://localhost:8080/xmlui/handle/123456789/28804 |
| ISBN: | 978-3-031-10617-0 |
| Appears in Collections: | POLITICAL |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Technology Assessment in a Globalized World.pdf | 377.2 kB | Adobe PDF | View/Open |
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