Browsing by Author van Est, Rinie
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 2023 | Technology Assessment in a Globalized World | Hennen, Leonhard; Hahn, Julia; Ladikas, Miltos; Lindner, Ralf; Peissl, Walter; van Est, Rinie |